動的特性化プラットフォーム

Dynamic Characterization Platform - SiC Applications Support

EVAL_DCP_01 - Dynamic Characterization Platform - SiC Applications Support

Product Number: EVAL_DCP_01
Application Note

The Dynamic Characterization Platform is designed to:

  • Measure
    • MOSFET switching losses, switching times, and gate charge accurately
    • Schottky Barrier Diode (SBD) and body diode reverse recovery accurately
  • Provide an informed reference design for gate drive and power loop PCB layout
  • Provide informed recommendations for gate drive layout and components
  • Promote streamlined device validation and quicker design cycles